MEASUREMENT OF TRANSISTOR NOISE FIGURE AT MF, HF, AND VHF
standard by JEDEC Solid State Technology Association, 11/01/1981
TEMPERATURE, BIAS, AND OPERATING LIFE
standard by JEDEC Solid State Technology Association, 06/01/2005
GUIDELINE FOR CONSTANT TEMPERATURE AGING TO CHARACTERIZE ALUMINUM INTERCONNECT METALLIZATIONS FOR STRESS-INDUCED VOIDING
standard by JEDEC Solid State Technology Association, 12/01/2000
POWER MOSFETS
standard by JEDEC Solid State Technology Association, 07/01/1985
Embedded Multi-media card (e*MMC), Electrical Standard (5.01)
standard by JEDEC Solid State Technology Association, 07/01/2014
GDDR5 SGRAM
standard by JEDEC Solid State Technology Association, 09/01/2009
BALL GRID ARRAY PINOUT FOR 1-, 2-, AND 3-BIT LOGIC FUNCTIONS
standard by JEDEC Solid State Technology Association, 03/01/2004
INFORMATION REQUIREMENTS FOR THE QUALIFICATION OF SILICON DEVICES
standard by JEDEC Solid State Technology Association, 11/01/2017
QUALITY SYSTEM ASSESSMENT (SUPERSEDES JESD39-A)
standard by JEDEC Solid State Technology Association, 06/01/1997
NAND Flash Interface Interopability
standard by JEDEC Solid State Technology Association, 06/01/2019
ADDENDUM No. 7 to JESD24 – COMMUTATING DIODE SAFE OPERATING AREA TEST PROCEDURE FOR MEASURING dv/dt DURING REVERSE RECOVERY OF POWER TRANSISTORS
Amendment by JEDEC Solid State Technology Association, 08/01/1982
Byte Addressable Energy Backed Interface
standard by JEDEC Solid State Technology Association, 09/01/2019