PROCEDURE FOR MEASURING INPUT CAPACITANCE USING A VECTOR NETWORK ANALYZER (VNA)
standard by JEDEC Solid State Technology Association, 10/01/2003
TEST METHOD FOR BEAM ACCELERATED SOFT ERROR RATE
standard by JEDEC Solid State Technology Association, 11/01/2007
DOUBLE DATA RATE (DDR) SDRAM SPECIFICATION
standard by JEDEC Solid State Technology Association, 02/01/2008
PROCESS FAILURE MODE AND EFFECTS ANALYSIS (FMEA)
standard by JEDEC Solid State Technology Association, 05/01/2005
ACCELERATED MOISTURE RESISTANCE – UNBIASED HAST
standard by JEDEC Solid State Technology Association, 07/01/2015
TEST METHODS AND CHARACTER DESIGNATION FOR LIQUID CRYSTAL DEVICES: Â
standard by JEDEC Solid State Technology Association, 05/01/1982
STEADY-STATE TEMPERATURE HUMIDITY BIAS LIFE TEST
standard by JEDEC Solid State Technology Association, 03/01/2009
ASSESSMENT OF AVERAGE OUTGOING QUALITY LEVELS IN PARTS PER MILLION (PPM)
standard by JEDEC Solid State Technology Association, 11/01/2017
THE MEASUREMENT OF TRANSISTOR NOISE FIGURE AT FREQUENCIES UP TO 20 kHz BY SINUSOIDAL SIGNAL-GENERATOR METHOD
standard by JEDEC Solid State Technology Association, 04/01/1968
FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 10/01/2011
STANDARD FOR DEFINITION OF THE SSTV16859 2.5 V, 13-BIT TO 26-BIT SSTL_2 REGISTERED BUFFER FOR STACKED DDR DIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 05/01/2003
A Guideline for Defining "Low-Halogen" Solid State Devices (Removal of BFR/CFR/PVC)
standard by JEDEC Solid State Technology Association, 11/01/2010